On the fifth order aberration in a sextupole corrected probe forming systemZHIFENG SHAO.Review of scientific instruments. 1988, Vol 59, Num 11, pp 2429-2437, issn 0034-6748Article

Correction of spherical aberration in the transmission electron microscopeZHIFENG SHAO.Optik (Stuttgart). 1988, Vol 80, Num 2, pp 61-75, issn 0030-4026Article

New lens for a low-voltage scanning electron microscopeZHIFENG SHAO.Review of scientific instruments. 1988, Vol 59, Num 9, pp 1965-1969, issn 0034-6748Article

Design principles of an optimized focused ion beam systemWANG, Y. L; ZHIFENG SHAO.Advances in electronics and electron physics. 1991, Vol 81, pp 177-209, issn 0065-2539Article

Two-dimensional phase retrieval from image and diffraction patterns in electron microscopesZHIFENG SHAO; XIMEN JIYE.Optik (Stuttgart). 1985, Vol 71, Num 1, pp 15-22, issn 0030-4026Article

Chromatic aberration effects in small electron probesZHIFENG SHAO; CREWE, A. V.Ultramicroscopy. 1987, Vol 23, Num 2, pp 169-174, issn 0304-3991Article

A study of an inhomogeneous gradient magnetic field spectrometer with a curvilinear axisXIMEN JIYE; ZHIFENG SHAO.Optik (Stuttgart). 1985, Vol 71, Num 2, pp 73-79, issn 0030-4026Article

On the optimization of ion microprobesZHIFENG SHAO; WANG, Y. L.Journal of vacuum science and technology. B. Microelectronics processing and phenomena. 1990, Vol 8, Num 1, pp 95-99, issn 0734-211X, 5 p.Article

Simple model of image formation by scanning tunneling microscopy of non-conducting materialsJIAN-YANG YUAN; ZHIFENG SHAO.Ultramicroscopy. 1990, Vol 34, Num 3, pp 223-226, issn 0304-3991, 4 p.Article

Adjustable four-electrode electron mirror as an aberration correctorZHIFENG SHAO; XIAO DONG WU.Applied physics letters. 1989, Vol 55, Num 26, pp 2696-2697, issn 0003-6951Article

On the resolution of the low-energy electron reflection microscope based on wave electron opticsZHIFENG SHAO; CREWE, A. V.Ultramicroscopy. 1989, Vol 31, Num 2, pp 199-203, issn 0304-3991Article

Properties of a four-electrode adjustable electron mirror as an aberration correctorZHIFENG SHAO; XIAO DONG WU.Review of scientific instruments. 1990, Vol 61, Num 4, pp 1230-1235, issn 0034-6748, 6 p.Article

Effect of probe force on the resolution of atomic force microscopy of DNAJIE YANG; ZHIFENG SHAO.Ultramicroscopy. 1993, Vol 50, Num 2, pp 157-170, issn 0304-3991Article

Canonical aberration theory of multipoles : a critical reanalysisZHIFENG SHAO; JIYE XIMEN.Journal of applied physics. 1992, Vol 71, Num 4, pp 1588-1593, issn 0021-8979Article

A study on the optimization of apertures in an aberrated probe forming systemZHIFENG SHAO; CREWE, A. V.Optik (Stuttgart). 1988, Vol 79, Num 3, pp 105-110, issn 0030-4026Article

Three dimensional algebraic reconstruction from three mutually orthogonal projectionsJIYE, X; ZHIFENG SHAO.Optik (Stuttgart). 1985, Vol 71, Num 4, pp 143-148, issn 0030-4026Article

Inexact reconstruction of multiple grey level objects from projectionsZHIFENG SHAO; CHONG JUN MU; KAPP, O. H et al.Optik (Stuttgart). 1987, Vol 76, Num 1, pp 12-17, issn 0030-4026Article

An optical detection low temperature atomic force microscope at ambient pressure for biological researchJIANXUN MOU; JIE YANG; ZHIFENG SHAO et al.Review of scientific instruments. 1993, Vol 64, Num 6, pp 1483-1488, issn 0034-6748Article

Three dimensional reconstruction from noisy projectionsCHONGJUN MU; ZHIFENG SHAO; KAPP, O. H et al.Optik (Stuttgart). 1988, Vol 79, Num 3, pp 99-104, issn 0030-4026Article

Structure and stability of pertussis toxin studied by in situ atomic force microscopyJIE YANG; JIANXUN MOU; ZHIFENG SHAO et al.FEBS letters. 1994, Vol 338, Num 1, pp 89-92, issn 0014-5793Article

High-resolution low-voltage electron optical system for very large specimensZHIFENG SHAO; LIN, P. S. D.Review of scientific instruments. 1989, Vol 60, Num 11, pp 3434-3441, issn 0034-6748, 8 p.Article

Molecular resolution atomic force microscopy of soluble proteins in solutionJIE YANG; JIANXUN MOU; ZHIFENG SHAO et al.Biochimica et biophysica acta (G). General subjects. 1994, Vol 1199, Num 2, pp 105-114, issn 0304-4165Article

On the optical properties of an electrostatic retarding field lensWANG, Y. L; LAI, M. Y; ZHIFENG SHAO et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1993, Vol 11, Num 2, pp 406-411, issn 0734-2101Article

Alternative method of imaging surface topologies of nonconducting bulk specimens by scanning tunneling microscopyJIAN-YANG YUAN; ZHIFENG SHAO; CHAO GAO et al.Physical review letters. 1991, Vol 67, Num 7, pp 863-866, issn 0031-9007Article

Direct visualization of surface charge in aqueous solutionCZAJKOWSKY, D. M; ALLEN, M. J; ELINGS, V et al.Ultramicroscopy. 1998, Vol 74, Num 1-2, pp 1-5, issn 0304-3991Article